PSON002 Physical characterization of cell lines using atomic force microscopy (AFM)
This study provides physical characterization of 30 cell lines from the Physical Sciences Oncology Center (PS-OC) Network Bioresource Core Facility (PBCF) using atomic force microscopy.
The goal of the study was to asses the effect of cell line growth substrate on the physical properties of individual cells from the cell lines. The study’s assay used atomic force microscopy (AFM) to measure the the deflection of a cantilever upon contact with the cells. In this study, the test samples represent 30 cell lines grown on 7 different substrates. Measurements were done in triplicate. Control samples were not included in this study.
Download dataset at |ftp://caftpd.nci.nih.gov/psondcc/PhysicalCharacterization/AFM.2/