__'''PSON0002 Physical Characterization of Cell Lines. Atomic Force Microscopy'''__  This study uses atomic force microscopy (AFM) to measure the the deflection of a cantilever upon contact with the cells. In this study, the test samples represent 30 cell lines grown on 7 different substrates. Measurements were done in triplicate. Control samples were not included in this study. Download the dataset at [ftp://caftpd.nci.nih.gov/psondcc/PhysicalCharacterization/AFM.2/]