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  • Created 22 Jan 2014

PSON0002 Physical Characterization of Cell Lines. Atomic Force Microscopy

PSON0002 Physical Characterization of Cell Lines. Atomic Force Microscopy‘ This study uses atomic force microscopy (AFM) to measure the the deflection of a cantilever upon contact with the cells. In this study, the test samples represent 30 cell lines grown on 7 different substrates. Measurements were done in triplicate. Control samples were not included in this study. Download the dataset at ftp://caftpd.nci.nih.gov/psondcc/PhysicalCharacterization/AFM.2/

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